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LOGIN |
| Role: open access |
| Action | |
|---|---|
| Id | I184 |
| User | moshantaf |
| Project | |
| Access | project |
| Open Access | ✔ |
| Edit History | SHOW |
| Date Created | 2024-06-04 15:03:37 |
| Date Modified | 2024-06-06 10:52:24 |
| Device | Scanning Electron Microscope |
|---|---|
| Manufacturer | Hitachi |
| Comment | Secondary Electron Detector Backscatter Electron Detector |
| Type | Microscope |
| Serial Number | XXXXX |
| FHI Inventory Number | XXXXX |
| Power (W) | |
| Current (A) | |
| Voltage (V) | |
| Maximum Operating Temperature | |
| Maximum Operating Pressure | |
| Measurement Range | |
| Maximum Flow | |
| Used By | Wiebke Frandsen |
| Location | FHI-Dahlem |
| Id | Project | ||
|---|---|---|---|
| E92 | Hitachi SEM s4800 | Wiebke Frandsen |
Haber Archive